Type-It Tester for Silicon Wafers, Ingots and Pot Scrap
Cutting Edge Technology for Accurate Type Testing N/P Substrates
21st Century New Design incorporates a computerized brain with a highly reliable three point probe head. Ergonomically designed probe handle with replaceable low cost pins. Pins have low spring force to minimize contact damage to wafers. Allows you to test type on Silicon Wafers and Pot Scrap. Digital display shows you the type (N, P, or Error). High thru-put with unique sound reporting. Reports type down to .01 ohms on most materials. Optional Hot Probe reports even lower ranges on films, oxides, and silicon.
- Type reporting using rectification method. 0.01 to 200 ohm cm Reference material: Oxide free silicon wafers and pot scrap
- LCD digital display shows last sample taken
- Front panel volume control
- Type handle with 3 point probe
- 1 year Warranty
- International version available (Universal power supply)
- UL approved wall transformer 120 volt/ 2 amp, AC USA Style plug
*** Terms and conditions apply. Complete terms and conditions are listed in our formal quotation which is available upon request.
