Pocket Go/No-Go Tester For Silicon Wafers, Ingots and Pot Scrap
Offers the following improvements over Chinese pen testers:
- adjustable setpoint (.5 to 10 ohm cm)
- works with wafers, ingots, chunks, potscrap
- better accuracy
- longer battery life and no rubber bands
- 1 year warranty
- made in USA
- serviced and supported in USA
- 4 point Signatone probe head with tungsten carbide pins for longer life, less dulling, better piercing of films/oxides
- Pass/Fail resistance testing on materials-0.1 to 200 ohm cm Reference material: Oxide free silicon wafers and pot scrap
- portable (4 AA Battery) operation
- one-handed operation
- LED and Audio indicators
- Low Battery indicator
- 7 1/8" x 2 ½" x 1"
- Fits in pocket or brief case
- Single Current Source: 1.00 mA
- LCD display of setpoint
- analog setpoint adjustment (.5 to 10 ohm cm)
- Integrated 4 Point Probe Technology
- 1 year Warranty
- accuracy: Typical +/- 3% @ 75 to 77 degrees F after 3 minute warm up, Maximum +/- 5% @ 75 to 77 degrees F after 3 minute warm up
*** Terms and conditions apply. Complete terms and conditions are listed in our formal quotation which is available upon request.
