Pocket Type Tester For Silicon Wafers, Ingots and Pot Scrap
21st Century New Design incorporates a computerized brain with a highly reliable three point probe head. Integrated probe head with replaceable low cost pins. Pins have low spring force to minimize contact damage to wafers. Allows you to test type on Silicon Wafers and Pot Scrap. Bicolor LED shows you the type (N, P). Portable tester; ideal for travel. Reports type down to .05 ohms on most materials.
- Portable Type Reporting Gauge-0.05 to 200 ohm cm Reference material: Oxide free silicon wafers and pot scrap*
- Automatically measures type when probe contacts material
- Uses Rectification (Contact) Technique
- Portable (4 AA Battery) operation
- One-handed operation
- Low Battery indicator
- 7 1/8" x 2 ½" x 1"
- Fits in pocket or brief case
- Single bicolor LED indicates N or P
- Integrated 3 Point Probe Technology
- Replaceable Pins
- 1 year Warranty
- Accuracy: .05 to 200 ohm cm material @ 75 to 77 degrees F after 3 minute warm up
- Kit includes: Tester, Batteries, Shipping/Carrying Case, Rubber Probe Cover
